郑博恺

2024-04-05阅读

 姓名:郑博恺
 性别:
 职称:讲师,硕导
 学位:博士
 电子邮件: Zhengbokai@fzu.edu.cn
 研究方向:电子系统可靠性评估、剩余寿命预测和故障诊断

教育工作经历

2024.1至今 yl7703永利官网 yl7703永利官网 讲师

2019.1~2020.1 意大利米兰理工大学 能源学院 联合培养博士生

2015.9~2023.12 哈尔滨工业大学 电机与电器专业 博士(硕博连读)

2011.9~2015.7 太原理工大学 电子信息工程专业 学士

科研简介

1. 国家部委延寿共性基础技术二期项目,电子系统贮存失效机理模型及贮存可靠性评估技术研究,参与,2021-2025.

2. 国家部委延寿共性基础技术一期项目,配电系统长贮可靠性鉴定试验技术研究,参与,2015-2017.

3. 国家部委预研专项子课题,可靠性预计数字模型及应用共性总体技术,参与,2022-2024.

4. 国家国防科技工业局民用航天预研项目,星载电源单机多应力加速寿命试验与寿命量化评价技术,参与,2019-2020.

代表性论文

[1] Zheng B K, Chen C*, Lin Y G, et al. Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process[J]. Reliability Engineering & System Safety, 2022, 217: 108087.

[2] Zheng B K, Chen C*, Lin Y G, et al. Reliability analysis based on a bivariate degradation model considering random initial state and its correlation with degradation rate[J]. IEEE Transactions on Reliability, 2023, 72(1): 37-48.

[3] Zhai G F, Zheng B K*, Ye X R, et al. A failure mechanism consistency test method for accelerated degradation test[J]. Quality and Reliability Engineering International, 2021, 37(2): 464-483.

[4] Zheng B K, Chen C*, Zhang W, et al. Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas[J]. Microelectronics Reliability, 2022, 138: 114640.

[5] Zheng B K, Ye X R*, Zhai G F. A Wiener-based degradation model considering four-source uncertainties and nonlinearity[C]. Proceedings of the 8th International Conference on Reliability of Electrical Products and Electrical Contacts (ICREPEC 2022). Xiamen, China, 2022: 35-38. (Invited paper)

[6] Zheng B K, Si S, Lin Y G, et al. A test method for failure mechanisms consistency of accelerated degradation test based on Wiener process[C]. 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE 2019). Zhangjiajie, China, IEEE, 2019: 404-409.

[7] Zheng B K, Deng J, Zhang K X, et al. Analog circuit soft fault based on fault-test dependency matrix and SVM[C]. Proceedings of the 6th International Conference on Reliability of Electrical Products and Electrical Contacts (ICREPEC 2017). Suzhou, China, 2017: 283-289.

[8] Ye X R, Hu Y F*, Zheng B K, et al. A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling[J]. Reliability Engineering & System Safety, 2022, 228: 108815.

专利

[1]. 翟国富, 郑博恺, 吴岳, 等. 继电器弹性金属材料加速贮存退化失效机理变化判别方法: ZL201711082103.7[P]. 2019-02-05.

[2] 陈岑, 郑博恺, 张东, 等. 一种基于初值-速率相关退化模型的可靠性评估方法: ZL202210459927.6[P]. 2022-10-11.

[3]. 叶雪荣, 胡义凡, 郑博恺, 等. 考虑多源不确定性的多参数相关退化产品可靠性评估方法: ZL202110438353.X[P]. 2022-04-21.

[4]. 叶雪荣, 陈昊, 郑博恺, 等. 一种继电器耐力学性能贮存退化分析方法: ZL201711092964.3[P]. 2018-09-25.

学术兼职

担任Reliability Engineering & System Safety、IEEE Transactions on Reliability等期刊审稿人

招生计划

电机与电器 学术型硕士研究生

电气工程 专业型硕士研究生

能源与动力 专业型硕士研究生

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